APA Style
SIMONS, DAVID PETER LOUIS. (1998).
data acquisition, detector technology, and materials analysis with a scanning ion microprobe (1).
Leiden:
Universiteit Eindhoven.
Chicago Style
SIMONS, DAVID PETER LOUIS.
data acquisition, detector technology, and materials analysis with a scanning ion microprobe.
1
Leiden:
Universiteit Eindhoven,
1998.
TXB.
MLA Style
SIMONS, DAVID PETER LOUIS.
data acquisition, detector technology, and materials analysis with a scanning ion microprobe.
1
Leiden:
Universiteit Eindhoven,
1998.
TXB.
Turabian Style
SIMONS, DAVID PETER LOUIS.
data acquisition, detector technology, and materials analysis with a scanning ion microprobe.
1
Leiden:
Universiteit Eindhoven,
1998.
TXB.