APA Style
ABRAN,ALAIN. (2010).
Software metrics and software metrology (1).
America:
John Wiley & Sons.
Chicago Style
ABRAN,ALAIN.
Software metrics and software metrology.
1
America:
John Wiley & Sons,
2010.
TXB.
MLA Style
ABRAN,ALAIN.
Software metrics and software metrology.
1
America:
John Wiley & Sons,
2010.
TXB.
Turabian Style
ABRAN,ALAIN.
Software metrics and software metrology.
1
America:
John Wiley & Sons,
2010.
TXB.